Retinex Image Processing--Publications--SPIE 5438, Orlando, Florida
Conference
Automatic assessment and reduction of noise using edge pattern analysis in
non-linear image enhancement
Daniel J. Jobson, Zia-ur Rahman, Glenn A. Woodell, Glenn Hines
Abstract
Noise is the primary visibility limit in the process of non-linear image
enhancement, and is no longer a statistically stable additive noise in
the post-enhancement image. Therefore novel approaches are needed to
both assess and reduce spatially variable noise at this stage in overall
image processing. Here we will examine the use of edge pattern analysis
both for automatic assessment of spatially variable noise and as a
foundation for new noise reduction methods.
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