Retinex Image Processing--Publications--SPIE 5438, Orlando, Florida Conference

Automatic assessment and reduction of noise using edge pattern analysis in non-linear image enhancement

Daniel J. Jobson, Zia-ur Rahman, Glenn A. Woodell, Glenn Hines


Noise is the primary visibility limit in the process of non-linear image enhancement, and is no longer a statistically stable additive noise in the post-enhancement image. Therefore novel approaches are needed to both assess and reduce spatially variable noise at this stage in overall image processing. Here we will examine the use of edge pattern analysis both for automatic assessment of spatially variable noise and as a foundation for new noise reduction methods.

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